INSTRUMENTATION
Atomic Force Microscopy (AFM)
One Day Online Instrumentation Program on Atomic Force Microscopy (AFM)
Workshop Highlights
Introduction and History of AFM
Basics and development of Atomic Force Microscopy
Evolution in nanoscience and biomaterials
Principle of AFM
Cantilever and sharp probe tip interaction
Measurement of atomic-scale forces
Imaging Modes
Contact mode
Non-contact mode
Tapping mode
Sample Preparation Techniques
Surface cleaning and mounting
Environmental control for soft samples
Case Study
Surface roughness analysis of nanocoatings
Applications and Examples
Nanomaterials surface study
Biomolecular imaging
Thin film characterization
Program Particulars
| Particulars | Details |
|---|
| Title | Atomic Force Microscopy (AFM) |
| Duration | 1 hour |
| Mode of Delivery | Online session |
| Program Fee | ₹149 (Individual Registration) |
| Deliverables | E-Certificate, Course Material |
| Target Audience | Students, Researchers, and Professionals in Nanotechnology, Materials Science, Biotechnology |
- ✓ Understand nanoscale surface characterization using probe-based techniques.
- ✓ surface roughness, morphology, and mechanical property data
Mrs.Nandhini Muthukumaran
Nanotechnologist
Founder and Director of Nano Nest Private Limited
Excels in the fabrication of nanoparticles
Expertise in characterization of nanomaterials
Skilled in curating scientific and technical workshops
Delivers complex concepts in a clear and understandable manner
Experienced in hands-on training and practical demonstrations
Strong ability to engage students, researchers, and professionals
Focused on industry-relevant and application-oriented learning
